The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...
Palo Alto, Calif.—Automatic test equipment maker Agilent Technologies now has a new final-test memory tester targeting MCP s (multi-chip packages) and discrete flash. Dubbed the Versatest Series Model ...
Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...
Introspect Technology is a member of JEDEC, the body that covers memory -- including the next-gen GDDR7 memory standard -- with Introspect shipping the world's first GDDR7 memory test system. The just ...
Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.
Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...
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