Abstract: Code-line-Ievel defect prediction (CLDP) is an effective technique to incorporate comprehensive measures for buggy line identification to optimize efforts in Software Quality Assurance ...
Abstract: The utilization of high-resolution electroluminescence (EL) images for defect inspection in photovoltaic modules has gained significant popularity. However, there are limited works on the ...
This is an official implementation of our paper AutoNAD [IEEE/ASME Transactions on Mechatronics, 2025]. The datasets used in this project need to be download from here (The datasets have been ...
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