Abstract: Selecting optimum test compression structure (number of channels, number of scan chains, decompressor structure etc.) for cores can reduce test time significantly. In recent times, Streaming ...
Abstract: With the biennial doubling of the number of transistors in a given area of silicon, contemporary integrated circuits (IC) are forging more and more often and will continue to forge complex ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback