Abstract: Bond wire lift-off is a major aging failure mode in insulated gate bipolar transistor (IGBT) modules, critically impacting their safe and reliable operation. This article presents power ...
Abstract: This article presents a subcell method for modeling electrically thin dielectric material sheets with thin-wire nets in the finite-difference time-domain (FDTD) method. We improved the ...
GM has filed a patent application for a vehicle window switch design, potentially consolidating multiple window functions ...
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